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－　　－22Toshinori HOSOKAWAProfessor, Department of Mathematical Information EngineeringToshinori Hosokawa is a professor at the Department of Mathematical Information Engineering, College of Industrial Technology, Nihon University. He received his B.E. degree in Electronics and Communication Engineering from Meiji University, Tokyo, Japan, in 1987. He also received his Ph.D. degree in Engineering from Meiji University in 2001. He worked for Matsushita Electric Industrial Co., Ltd from 1987 to 2003. He was temporarily with Semiconductor Technology Academic Research Center (STARC) from 2000 to 2003. Dr. Hosokawa was also a lecturer at Meiji University in 2001 and 2002. He joined Nihon University in 2003. Dr. Hosokawa’s research interests are automatic test pattern generation, fault simulation, design for testability, synthesis for testability, high level testing, logic simulation engine, fault diagnosis, hardware Trojan, and logic encryption. He is a member of the IEEE, the IEICE and the IPSJ.Research Achievements1)A Don’t Care Filling Method for Low Capture Power based on Correlation of FF Transitions Using SAT, IEICE Transaction on Fundamentals, E100-A(12), 2824-2833, Dec 2017.2)A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths, Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 293-298, July 2019.3)A Capture Safe Static Test Compaction Method Based on Don’t Cares, Proceedings of the 24th IEEE International Symposium on On-Line Testing and Robust System Design, 195-200, July 2018.4)A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively, Proceedings of IEEE the 22nd International Symposium Defect and Fault Tolerance in VLSI and Nanotechnology Systems, S2-4 1-6, Oct 2019.5)Strongly Secure Scan Design Using Extended Shift Registers and Evaluation of Security, IEICE on Information and Systems, Vol.J101-D (8), 1165-1175, Aug. 2018. Fig.1 Loc Test Generation Model of M1Fig.2 Low Power Test Cube Compatibility Graph