Toshinori Hosokawa received the B.E. degree in Electronics and Communication Engineering from Meiji University, Tokyo, Japan, in 1987. He also received the Ph.D. degree in Engineering from Meiji University in 2001. He was with Matsushita Electric Industrial Co., Ltd from 1987 to 2003. He was temporarily with Semiconductor Technology Academic Research Center (STARC) from 2000 to 2003. He was also a lecturer at Meiji University in 2001 and 2002. He joined Nihon University in 2003. Presently he is a professor at Department of Mathematical Information Engineering, College of Industrial Technology, Nihon University, Chiba, Japan. His research interests are automatic test pattern generation, fault simulation, design for testability, synthesis for testability, high level testing, logic simulation engine, fault diagnosis, secure scan design, hardware Trojan, and logic locking. He is a member of the IEEE, the IEICE and the IPSJ.Hideyuki Takano received the B.E. degree in College of Industrial Technology, Nihon University, Chiba, Japan, in 2014. He also received the M.E. degree from Nihon University in 2016. Presently he is with Fujitsu Computer Technologies Ltd. His research interests are fault diagnosis and fault simulation.Hiroshi Yamazaki received his B.E., M.E., and Ph.D degrees from College of industrial technology, Nihon University, in 2010, 2012, and 2015 respectively. Presently he is a Research Assistant at Department of Liberal Arts and Basic Sciences, College of Industrial Technology, Nihon University, Chiba, Japan. His research interests are SAT-based test generation, don’t care identification, low power test generation, design for testability, and secure scan design.Koji Yamazaki received the B.S., M.S. and Ph.D degrees from Meiji University, Kawasaki, Japan, in 1989, 1991 and 1994, respectively. In 1994, he joined the Department of Computer Science, Meiji University, Japan, as a lecturer. Since 2004 he has been an associated professor in the School of Information and Communication, Meiji University, Japan. His research interests are fault diagnosis and test generation. He is a member of IEEE (Institute of Electrical & Electronics Engineers) and IEICE (Institute of Electronics, Information and Communication Engineers).─ 19 ─Biographical Sketches of the Authors
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